significant degradation at high drain bias
The degradation mechanisms of GaN MMIC power amplifiers under on-state with high drain bias are systematically revealed, providing a basis for reliability optimization.
Hao, Zhang · Zheng, Xuefeng · Danmei, Lin · Hong, Yue Hua · Zhou, Jiuding · Lv, Ling · Cao, Yanrong · Han, Hongbo · Zhang, Weidong · Zhang, J. F. · Ma, Xiaohua · 74227950
IEEE Transactions on Electron Devices 2024